• Achieved early detection of cause of defects in raw materials through AI, becoming "first to overcome this challenge in the industry"
  • Applied to high-value semiconductor substrates, analyzing raw material defects in only one minute
  • Reduces defect analysis time by up to 90%
SEOUL, South Korea, Oct. 7, 2024 /PRNewswire/ -- Today, LG Innotek (CEO Moon Hyuksoo) announced the development and application of the industry's first "Artificial Intelligence (AI)-based inspection system for incoming raw materials", designed to detect defects at the point of receipt and prevent the use of substandard raw materials in the process.

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